Method and apparatus for layout independent test point placement on a printed circuit board
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United States of America Patent
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Mar 13, 2007
Grant Date -
Apr 27, 2006
app pub date -
Oct 25, 2004
filing date -
Oct 25, 2004
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A layout independent test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. Each test access point structure is conductively connected to various locations along a trace at a test access point and above an exposed surface of the printed circuit board to be accessible for probing by a fixture probe.
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