On-site analysis system with central processor and method of analyzing
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United States of America Patent
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Mar 20, 2007
Grant Date -
Aug 14, 2003
app pub date -
Jul 5, 2002
filing date -
Jul 23, 2001
priority date (Note) -
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status (Latency Note)
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Abstract
A method of analysis, analysis system, program product, apparatus, and method of supplying analysis of value incorporating the use of at least one data acquisition device, a central processor, and a communication link that is connectable between the data acquisition device and the central processor. The central processor is loaded with multivariate calibration models developed for predicting values for various properties of interest, wherein the calibration models are capable of compensating for variations in an effectively comprehensive set of measurement conditions and secondary material characteristics. As so configured, the calibration models can compensate for instrument variance without instrument-specific calibration transfer. Measurement results generated by the central processor can be transmitted to an output device of a user interface.
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