Non-volatile memory and method with reduced source line bias errors

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United States of America Patent

PATENT NO 7196931
APP PUB NO 20040057287A1
SERIAL NO

10254830

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Source line bias is an error introduced by a non-zero resistance in the ground loop of the read/write circuits. During sensing the control gate voltage of a memory cell is erroneously biased by a voltage drop across the resistance. This error is minimized when the current flowing though the ground loop is reduced. A method for reducing source line bias is accomplished by read/write circuits with features and techniques for multi-pass sensing. When a page of memory cells are being sensed in parallel, each pass helps to identify and shut down the memory cells with conduction current higher than a given demarcation current value. In this way, sensing in subsequent passes will be less affected by source line bias since the total amount of current flow is significantly reduced by eliminating contributions from the higher current cells.

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Patent Owner(s)

  • SANDISK TECHNOLOGIES LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cernea, Raul-Adrian Santa Clara, CA 131 7379
Li, Yan Milpitas, CA 1328 19621

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