TFT-LCD source driver with built-in test circuit and method for testing the same
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Apr 3, 2007
Grant Date -
Feb 2, 2006
app pub date -
Apr 26, 2005
filing date -
Jul 30, 2004
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A TFT-LCD source driver with a built-in test circuit includes N driving units and P test units. Each driving unit receives digital data and generates an analog output signal according to the digital data. Each test unit receives the analog output signals, selects one of them as a test signal according to a select signal, and compares the test signal with a high reference voltage and a low reference voltage to output an indication signal. The indication signal is set to indicate an abnormal state as the voltage of the test signal is higher than the high reference voltage or lower than the low reference voltage.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully