Resistive probe tips
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United States of America Patent
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Apr 10, 2007
Grant Date -
Jun 23, 2005
app pub date -
Dec 17, 2004
filing date -
Dec 18, 2003
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe has a probing end for probing electronic circuitry and a connection end for interfacing with a probing head. The resistive conducting material forms at least one path through the encapsulating material from the probing end to the connection end. The resistive conducting material may be a plurality of longitudinally extending resistive/conductive members or a plurality of particulate resistive/conductive members.
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