Device and method for measuring thickness
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United States of America Patent
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Apr 17, 2007
Issued Date -
N/A
app pub date -
Mar 2, 2006
filing date -
Sep 5, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A device for measuring thickness of an object has a vibration generator for generating vibrations in the object, a vibration detector for detecting vibrations generated in the object by the vibration generator and a frequency analyzer for calculating resonance frequency of the object. The vibration generator includes a light-emitting part which emits light towards the object to irradiate and to be absorbed by the object. A plurality of vibration detectors may be used and the frequency analyzer may include a sound speed analyzer for calculating speed of sound inside the object from vibrations detected by these plurality of vibration detectors.
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