Probe for combined signals
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United States of America Patent
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Apr 17, 2007
Grant Date -
Sep 28, 2006
app pub date -
May 25, 2006
filing date -
Nov 13, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
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