Apparatus and methods for the inspection of objects

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7206443
SERIAL NO

09633756

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for inspecting objects comprising: creating a reference image for a representative object, the reference image comprising an at least partially vectorized first representation of boundaries representing the representative object; acquiring an image of an object under inspection comprising a second representation of boundaries representing the object under inspection; and comparing a location of at least some boundaries in the second representation of boundaries to a location of corresponding boundaries in the at least partially vectorized first representation of boundaries, thereby to identify defects.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
3COM CORPORATIONPALO ALTO, CA7
ORBOTECH LTD.YAVNE57

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Duvdevani, Sharon Mazkeret Batya, IL 3 85
Gilat-Bernshtein, Tally Yavne, IL 7 140
Klingbell, Eyal Rehovot, IL 4 91
Mayo, Meir Rehovot, IL 3 85
Rippa, Shmuel Ramat Gan, IL 3 85
Smilansky, Zeev Meishar, IL 30 448

Cited Art Landscape

Patent Info (Count) # Cites Year
 
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OMRON CORPORATION (1)
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COGNEX CORPORATION (3)
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* Cited By Examiner

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
SHARP KABUSHIKI KAISHA (15)
7889932 Methods and systems for detecting regions in digital images 1 2006
* 2007/0206,855 Methods and systems for detecting regions in digital images 0 2006
8630498 Methods and systems for detecting pictorial regions in digital images 0 2006
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* 2007/0291,120 Methods and Systems for Identifying Regions of Substantially Uniform Color in a Digital Image 18 2006
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VISTEC SEMICONDUCTOR SYSTEMS GMBH (1)
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TECHINSIGHTS INC. (3)
7765517 Method and apparatus for removing dummy features from a data structure 3 2007
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HON HAI PRECISION INDUSTRY CO., LTD. (2)
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SHARP LABORATORIES OF AMERICA, INC. (1)
* 2009/0041,344 Methods and Systems for Determining a Background Color in a Digital Image 1 2007
 
NATIONAL APPLIED RESEARCH LABORATORIES (1)
* 2013/0235,186 Apparatus and Method for Inspecting Chip Defects 0 2012
 
FUJI MACHINE MFG. CO., LTD. (1)
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LYNX GEOSYSTEMS, LLC A Colorado Limited Liability Company (1)
* 2009/0142,002 POLYGON AND POLYLINE MEASURING TOOL FOR GIS APPLICATIONS 5 2008
 
NGR INC. (17)
* 7660455 Pattern inspection apparatus, pattern inspection method, and recording medium 7 2005
* 2005/0226,494 Pattern inspection apparatus, pattern inspection method, and recording medium 24 2005
7817844 Pattern inspection apparatus and method 17 2005
* 2005/0146,714 Pattern inspection apparatus and method 43 2005
7796801 Pattern inspection apparatus and method 27 2006
* 2006/0245,636 Pattern inspection apparatus and method 49 2006
7983471 Pattern inspection apparatus and method 4 2007
* 2008/0130,982 Pattern inspection apparatus and method 24 2007
8422761 Defect and critical dimension analysis systems and methods for a semiconductor lithographic process 2 2009
* 2010/0158,345 Defect And Critical Dimension Analysis Systems And Methods For A Semiconductor Lithographic Process 4 2009
8150140 System and method for a semiconductor lithographic process control using statistical information in defect identification 6 2010
* 2010/0215,247 System And Method For A Semiconductor Lithographic Process Control Using Statistical Information In Defect Identification 9 2010
8045785 Pattern inspection apparatus and method 8 2010
* 2010/0303,334 PATTERN INSPECTION APPARATUS AND METHOD 7 2010
8285031 Pattern inspection apparatus and method 4 2011
* 2011/0235,895 PATTERN INSPECTION APPARATUS AND METHOD 3 2011
9189843 Pattern inspection apparatus and method 0 2012
 
PALO ALTO RESEARCH CENTER INCORPORATED (1)
9035673 Method of in-process intralayer yield detection, interlayer shunt detection and correction 0 2010
 
HARRIS CORPORATION (1)
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COGNEX CORPORATION (2)
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* 2011/0314,385 METHOD AND APPARATUS FOR PRODUCING GRAPHICAL MACHINE VISION CONTENT FOR DISTRIBUTION VIA A NETWORK 0 2011
 
SEMICONDUCTOR INSIGHT INC. (2)
* 8219940 Method and apparatus for removing dummy features from a data structure 1 2005
* 2007/0011,628 Method and apparatus for removing dummy features from a data structure 18 2005
* Cited By Examiner

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