Probe card
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Apr 24, 2007
Grant Date -
May 12, 2005
app pub date -
May 5, 2004
filing date -
Nov 7, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
It is an object of the present invention to provide an arch type probe capable of enduring a load caused by overdriving even if the probe is miniaturized, and a probe card using the same. An arch type probe 200 has a shape including a first quarter circle arc portion 210 which is supported at one end thereof by the base plate 100 and a second quarter circle arc portion 220 which is connected to the other end of the first quarter circle arc portion 210, extending toward the base plate and a little shorter than the first quarter circle arc portion 221. The top portion of the arch type probe 200 serves as a contact surface brought into contact with an electrode of a semiconductor water B.
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