Cam reference for inspection of contour images
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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May 15, 2007
Grant Date -
Jan 16, 2003
app pub date -
Dec 22, 2000
filing date -
Dec 23, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analyzing the inspection output, the analyzing including comparing the inspection output with a computer file reference identifying more than two different types of regions. A method for inspecting an electrical circuit inspection is also disclosed.
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