Method and apparatus for sediment characterization
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United States of America Patent
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May 29, 2007
Grant Date -
Apr 27, 2006
app pub date -
Oct 25, 2005
filing date -
Oct 26, 2004
priority date (Note) -
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Abstract
A method for characterizing contaminants within sediment comprising positioning a sampler in a continuous manner within the sediment, exposing the sampler to the sediment for a dwell time, retrieving the sampler, and analyzing the sampler. The sampler is exposed to the sediment for a sufficient period of time to allow at least one analyte of interest to permeate the sampler. The sampler may be analyzed using fluorescence and/or gas chromatography/mass spectrometry to determine contamination versus sampler length. The contamination versus sampler length may be converted to contamination versus depth or contamination versus horizontal position.
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