Laser wavefront characterization
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United States of America Patent
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Jun 19, 2007
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N/A
app pub date -
Jul 30, 2004
filing date -
Jul 30, 2003
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Abstract
The device and method of the present invention are useful for determining the characteristics of an infrared wavefront. The present invention involves positioning a beam of light containing the infrared wavefront to be characterized onto a distorted grating, using the grating to produce a plurality of images, determining the infrared wavefront from the plurality of images and analyzing the infrared wavefront for features that characterize the infrared wavefront.
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