Eddy current inspection method and system
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United States of America Patent
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Jun 19, 2007
Grant Date -
Oct 12, 2006
app pub date -
Apr 6, 2005
filing date -
Apr 6, 2005
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
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