Dynamic light scattering measurement apparatus using phase modulation interference method
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United States of America Patent
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Jun 26, 2007
Grant Date -
Jun 9, 2005
app pub date -
Oct 20, 2004
filing date -
Oct 20, 2003
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Abstract
A dynamic light scattering measurement apparatus using a phase modulation type interference method includes an optical coupler for dividing light from a low coherent light source, a converging lens for irradiating one of the divided lights to a sample 9, phase modulators for modulating the phase of the other divided lights, a spectrum measurement means for measuring a spectrum of the interference light of the phase-modulated reference light and the scattered light outgoing from the sample, and an analyzing means for measuring the dynamic light scattering of particles of the sample based on the first order spectrum corresponding to the basic frequency of the phase-modulating signal or a higher order spectrum corresponding to a frequency equal to two, three or the like times the basic frequency appearing in the interference light spectrum measured by the spectrum measurement means. An amount s/L obtained by normalizing the light path length s within the sample by the mean free path L of the particles is set to be not more than 3. Dynamic properties of a high concentration medium can be measured with high precision based on the scattered light from such medium.
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Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| OTSUKA ELECTRONICS CO LTD | OSAKA |
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Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Ishii, Katsuhiro | Sapporo, JP | 19 | 105 |
| Iwai, Toshiaki | Sapporo, JP | 22 | 104 |
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| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
| Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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