System and method for conducting BIST operations
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United States of America Patent
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Jul 3, 2007
Grant Date -
Jun 1, 2006
app pub date -
Nov 8, 2004
filing date -
Nov 8, 2004
priority date (Note) -
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status (Latency Note)
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Abstract
Method and system for initiating a built in self test ('BIST') operation for memory modules is provided. The method includes, determining if a test access port ('TAP') controller instruction or an internal register control bit are to be used for initiating the BIST operation; sending the internal register control bit to a memory BIST controller for initiating the BIST operation; and setting a status bit in the internal register after the BIST operation is complete. The system includes a storage controller with an internal register for setting a control bit for initiating a BIST operation; a test access port ('TAP') controller for sending an instruction to a memory BIST controller to initiate a BIST operation; and a multiplexer for selecting between the control bit and the instruction for initiating the BIST operation.
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