Probe station with low inductance path
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United States of America Patent
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Jul 31, 2007
Issued Date -
N/A
app pub date -
Sep 25, 2003
filing date -
Nov 25, 2002
priority date (Note) -
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Abstract
A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test instrumentation and the electrical device being tested.
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