Testing of an integrated circuit having an embedded processor
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United States of America Patent
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Sep 11, 2007
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N/A
app pub date -
Apr 30, 2004
filing date -
Apr 30, 2004
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Abstract
Method and apparatus for generating a test program for an integrated circuit having an embedded processor. One embodiment has a system which includes an embedded microprocessor; a plurality of assembly language instructions stored in a memory, where the assembly language instructions substantially exercise a critical path or a path closest to the critical path in the embedded microprocessor; and programmable test circuitry having a programmable clock circuit for providing a multiplied clock signal to the embedded microprocessor in order to execute the assembly language instructions.
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