Interface test system
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United States of America Patent
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Sep 18, 2007
Grant Date -
Nov 10, 2005
app pub date -
May 4, 2005
filing date -
May 4, 2004
priority date (Note) -
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status (Latency Note)
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Abstract
High to medium voltage interface test systems and methods of testing high to medium voltage systems are provided. A high to medium voltage interface test device for testing a circuit connected comprises a block having a first aperture and a plug having a finger to insert into the first aperture. The finger can have insulation disposed between pins to isolate the pins, maintain correct polarity for the circuit, and open and connect to a circuit substantially simultaneously. An interface testing method for testing a high to medium voltage circuit can comprise inserting a finger of a test module into a first aperture of a block module, opening the circuit with the finger, and connecting the finger to the circuit. The opening and connecting to the circuit occur substantially simultaneously to achieve a make-before-break sequence.
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