Method and means for correcting measuring instruments
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United States of America Patent
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Sep 18, 2007
Grant Date -
May 5, 2005
app pub date -
Dec 11, 2002
filing date -
Jan 10, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention relates to measuring instruments, preferably of the kind measuring absorbances, in an object, of electromagnetic radiation in at least two spectral ranges, such as IR instruments, and DXR, meaning Dual X-ray instruments, and more specifically to the determination of properties of food or feed, such as the fat content in milk or meat. The invention relates in particular to a method of providing a correction for a slave instrument of the kind measuring properties of an object by exposing the object to electromagnetic radiation, in particular X-rays, in at least two spectral ranges and obtaining one or more object responses thereto. The responses obtained being preferably based on detecting attenuation and/or reflection and/or scatter of the electromagnetic radiation in/from the object by use of one or more detectors and are obtained in a form where they express properties of the object either directly or via a transformation.
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