Device and method for spectroscopic measurement with an imaging device comprising a matrix of photodetectors

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United States of America Patent

PATENT NO 7277170
APP PUB NO 20050024639A1
SERIAL NO

10933165

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Abstract

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A device and a method for spectroscopic measurement of the spectrum of a light beam. The method includes detecting the dispersed light fluxes of the beam on an imaging device comprising a matrix of photodetectors with active columns, directing the imaging device so that one wavelength is allocated to a line of photodetectors, determining for each light flux the exposure time .tau..sub.i necessary to measure a maximal intensity I.sub.max and the sub-matrix M.sub.i of photodetectors associated with the light fluxes, allocating to the sub-matrix M.sub.i of photodetectors an exposure time .tau.'.sub.i so that .tau.'.sub.i is the largest integer divider of the total integration time T smaller than .tau..sub.i, measuring and resetting, during the integration time T of said spectrum, at each time .tau.'.sub.i, the corresponding sub-matrix M.sub.i independently of the other sub-matrices M.sub.j with j.noteq.i, and measuring the spectrum of the beam at the time T.

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Patent Owner(s)

Patent OwnerAddress
HORIBA JOBIN YVON S A S91160 LONGJUMEAU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Danthez, Yves La Norville, FR 4 6
Fretel, Emmanuel Epinay sur Orge, FR 4 13
Mirza, Arshad Lewittown, PA 3 41
Wallerand, Catherine Massy, FR 1 3

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