Method and apparatus for pulse I-V semiconductor measurements
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United States of America Patent
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Oct 9, 2007
Grant Date -
N/A
app pub date -
Sep 29, 2004
filing date -
Sep 29, 2004
priority date (Note) -
Expired
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Abstract
A method for measuring a value of an electrical characteristic of a device under test in a circuit having a load impedance includes applying a voltage to said circuit, the voltage having a selected amplitude; measuring a current in the circuit in response to the voltage; calculating an error value using the impedance, amplitude and current; adjusting the amplitude using the error value; and repeating the preceding steps until the error value reaches a desired value. This results in the selected amplitude changing from an initial value to a final value and the current changing to a final value. The initial value of the selected amplitude and the final value of the current are used to determine the electrical characteristic value.
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