RFID device test thresholds systems and methods
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United States of America Patent
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Nov 13, 2007
Grant Date -
Oct 12, 2006
app pub date -
Apr 7, 2005
filing date -
Apr 7, 2005
priority date (Note) -
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status (Latency Note)
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Abstract
Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.
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