Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe
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United States of America Patent
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Nov 20, 2007
Grant Date -
Feb 22, 2007
app pub date -
Jul 14, 2006
filing date -
Aug 16, 2005
priority date (Note) -
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Abstract
The present invention relates to an improved method for the simultaneous calibration and qualification of a non-contact probe on a localizer using a single artifact, in which non-contact probe readings and localizer readings are synchronised using parameters determined simultaneously with calibration and qualification. The invention also relates to a non-contact probe and other devices, and a computer program for performing the invention.
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