Method for estimating the remaining life span of an X-ray radiator
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United States of America Patent
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Nov 27, 2007
Grant Date -
Aug 16, 2007
app pub date -
Aug 20, 2004
filing date -
Aug 22, 2003
priority date (Note) -
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status (Latency Note)
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Abstract
In a method for estimating the remaining life span of an X-ray radiator that has been installed in an X-ray apparatus and is operational, under specified test conditions and at time intervals, a measurement value that is indicative for the remaining life span of the X-ray radiator is determined and stored in a memory. A forecasted progression of future measurement values is then forecasted from the instantaneous measurement value and previous measurement values that were determined under identical test conditions, which also are stored in the memory. The forecasted remaining life span of the X-ray radiator is then determined based on the forecasted progression and a limit value that is associated with the individual X-ray radiator, which is stored in the memory.
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