Interferometric optical apparatus and method using wavefront division

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7310151
APP PUB NO 20060044566A1
SERIAL NO

11161892

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A system and method of optical reflectometry and optical coherence tomography (OCT) is provided by using a wavefront-division interferometer where a beam is split into side-by-side beam portions. The interference is tuned by changing the phase difference between the beam portions. The interference contrast is adjusted by changing the ratio of the beam portions. The structure of the optical reflectometry and OCT is compact and insensitive to environmental changes. Methods are also provided for multi-level and multi-layer optical data storage systems.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
LI CHIAN CHIUNot Provided

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Li, Chian Chiu San Jose, CA 114 752

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation