Probe apparatus and method for examining a sample
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United States of America Patent
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Jan 1, 2008
Grant Date -
May 20, 2004
app pub date -
Jan 30, 2002
filing date -
Jan 30, 2001
priority date (Note) -
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Abstract
A probe for examining a sample (5), the probe including an emitter (1) for emitting radiation, a detector (1) for detecting radiation and a dielectric member (3) configured to direct radiation from the emitter (1) to the sample (5) and to direct radiation reflected by the sample (5) to the detector (1), wherein in use, the dielectric member (3) occupies at least half of the radiation path length from the emitter (1) to the sample (5) to the detector (1).
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