Electrical test probes, methods of making, and methods of using
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United States of America Patent
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Jan 1, 2008
Grant Date -
Dec 22, 2005
app pub date -
Jun 16, 2005
filing date -
Jun 16, 2004
priority date (Note) -
In Force
status (Latency Note)
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Abstract
Disclosed herein is an electronic test probe including a compression spring disposed in the housing in engagement with a plunger, the compression spring including a first section of coils including a first centerline and a second section of coils including a second centerline spaced apart from and parallel to the first centerline.
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