Device for monitoring quiescent current of an electronic device
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United States of America Patent
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-
Jan 1, 2008
Grant Date -
Jul 21, 2005
app pub date -
Mar 15, 2005
filing date -
Jul 3, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention is related to a device (1) for measuring the quiescent current I.sub.DDQ drawn by an electronic device such as a CMOS device or an IC, from a supply voltage. The quiescent current is drawn in between switching peaks, and is a measure for the quality of a device under test. The measurement device of the invention comprises a current measuring unit (6), and parallel to this CMU (6), a current bypass unit CBU (20), comprising a power MOSFET. In the CBU of the invention, a connection (51) is present between a terminal other than the gate or base of one driver transistor and the source of the MOSFET, thereby minimising the charge transfer effects which are likely to occur during switching of the MOSFET. The invention is further related to a measurement device for IDDQ measurement comprising a current offset unit (21), which is aimed at improving the measurement range, without losing measurement resolution.
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