Method for detecting faults in electronic devices, based on quiescent current measurements
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United States of America Patent
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Jan 1, 2008
Grant Date -
Jan 8, 2004
app pub date -
May 22, 2003
filing date -
May 23, 2002
priority date (Note) -
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Abstract
The present invention is related to a method for testing a micro-electronic device, by applying a plurality of test vectors to said device, and measuring for each test vector, the quiescent supply current I.sub.DDQ, to said device, wherein each I.sub.DDQ measured value is divided by another I.sub.DDQ value, and wherein the result of said division is compared to a predefined reference, resulting in a pass or fail decision for said device.
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