Node position measuring system

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7321575
APP PUB NO 20060133271A1
SERIAL NO

11293215

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A node position measuring system according to this invention includes a node, a reference station, base stations, a server that calculates a position of the node, and a network. The reference station includes a positioning signal reception module and a reference signal generation module that transmits a reference signal after the positioning signal reception module receives the positioning signal. Each of the base stations includes a signal reception module, a reception time measuring module that detects specific patterns from the positioning signal and the reference signal received by the signal reception module to measure a detection time, and a communication module that transmits time information, which is generated from the time measured by the reception time measuring module, to the server. The server includes a position calculation module that calculates the position of the node based on the time information transmitted from the base station.

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Patent Owner(s)

  • HITACHI, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujiwara, Ryosuke Kokubunji, JP 37 360
Mizugaki, Kenichi Kokubunji, JP 27 393

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