Quality factor
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United States of America Patent
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Jan 29, 2008
Grant Date -
Jan 20, 2005
app pub date -
Nov 25, 2002
filing date -
Nov 23, 2001
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The present invention concerns the discrimination of good measurement results measured by a computer vision system from bad results. By the method of the invention, values calculated from the observation vectors of several measuring devices can be discriminated into good and bad values by using a quality factor. The quality factor is calculated from the parameters of an error ellipsoid. The error ellipsoid is formed using the calculated value and the observation vectors. If the value calculated from the error ellipsoid parameters exceeds a threshold value that has been input, then the measurement result is rejected.
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