Analog built-in self-test module
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United States of America Patent
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Feb 5, 2008
Grant Date -
May 3, 2007
app pub date -
Nov 2, 2005
filing date -
Nov 2, 2005
priority date (Note) -
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Abstract
An analog BIST (Built-in Self-Test) module for a load board in a test system for testing Integrated Chips (IC) and other devices-under-test (DUTs). Components of the test module perform test setup, transmission of analog test signals to a DUT, capture of analog and digital test data from the DUT, and on-board analysis of the test data using DSPs without sending the test data to a tester. Modules may be add-on boards to load boards an contain one or more processors and multiple components to test DUTs in parallel, significantly decreasing test and analysis times of a test system such as a Very Low Cost Tester (VLCT).
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