Test strip system
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United States of America Patent
Stats
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Feb 5, 2008
Grant Date -
Aug 22, 2002
app pub date -
Jan 10, 2002
filing date -
May 20, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention provides a test field system, including a test strip with a test field, and a measuring device having a test strip receiver for measuring the test field. The test strip receiver inducing a support surface for the test strip and positioners for holding the test strip inserted in the strip receiver so that a section of the test strip containing the test field is held in a definite position relative to the support surface. The strip receiver having two holding members spaced from one another on edge areas of the support surface for holding fast associated edges of the test strip substantially adjacent the support surface, the support surface in a middle area between the holding means is vertically displaced from the edge areas such that the test field of a test strip inserted in the test strip receiver is spaced apart from the support surface.
First Claim
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| LRE TECHNOLOGY PARTNER GMBH | FRANKFURTER RING 15 MUENCHEN 80807 |
International Classification(s)
Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Markart, Ernst | Munich, DE | 18 | 742 |
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| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|
| Fee | Large entity fee | small entity fee | micro entity fee |
|---|---|---|---|
| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
| Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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