Conductor inspection apparatus and conductor inspection method

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7332914
APP PUB NO 20060226851A1
SERIAL NO

10547355

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Abstract

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Disclosed is a conductor inspection apparatus capable of detecting a state of an inspection-target electric conductor with a high degree of accuracy in a non-contact manner. The inspection apparatus includes a signal supply section 510 for supplying an inspection signal to an inspection-target conductor 520, and two sensor plates 570, 580 disposed approximately parallel to each other in the vicinity of the conductor 520. The inspection apparatus is designed to inspect a configuration of the conductor 520 disposed opposed to the sensor plate 570, in accordance with a measured signal level from the sensor plate 570. The inspection apparatus further includes a subtracter 550 for subjecting respective detected signal values from the sensor plates 570, 580 to subtraction, and a divider 560 for dividing the detected signal value from a selected one of the sensor plates by the subtraction result to normalize the detected signal value from the selected sensor plate so as to detect a relative ratio between the detected signal values from the sensor plates to obtain a value X corresponding a distance between the selected sensor plate and the conductor 520, as a detection result.

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Patent Owner(s)

Patent OwnerAddress
OHT INCHIROSHIMA COUNTY JAPAN HIROSHIMA

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hayashi, Mishio Saitama, JP 24 193
Ishioka, Shogo Hiroshima, JP 23 154
Nurioka, Akira Fukuyama, JP 4 23
Yamaoka, Shuji Fukuyama, JP 28 225

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