Method and apparatus of manipulating a sample
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United States of America Patent
Stats
-
Feb 26, 2008
Grant Date -
Nov 2, 2006
app pub date -
May 9, 2006
filing date -
Mar 9, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.
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