Atomic probes and media for high density data storage
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United States of America Patent
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Feb 26, 2008
Grant Date -
Jun 8, 2006
app pub date -
Dec 29, 2005
filing date -
Oct 15, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A device in accordance with embodiments of the present invention comprises a contact probe for high density data storage reading, writing, erasing, or rewriting. In one embodiment, the contact probe can include a silicon core having a conductive coating. Contact probes in accordance with the present invention can be applied to a phase change media, for example, to form an indicia in the phase change media by changing the electrical resistivity of a portion of the phase change media.
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