Method of making photomask blank substrates

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7344808
APP PUB NO 20050020083A1
SERIAL NO

10896946

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Abstract

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A photomask blank substrate is made by polishing a starting substrate to a specific flatness in a principal surface region on a top surface of the substrate so as to form a polished intermediate product, then additionally polishing the intermediate product. Substrates made in this way exhibit a good surface flatness at the time of wafer exposure. When a photomask fabricated from a blank obtained from such a substrate is held on the mask stage of a wafer exposure system with a vacuum chuck, the substrate surface undergoes minimal warping, enabling exposure patterns of small geometry to be written onto wafers to good position and linewidth accuracies.

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Patent Owner(s)

Patent OwnerAddress
NIKON CORPORATION1-5-20 NISHIOI SHINAGAWA-KU TOKYO 1408601 ?1408601
SHIN-ETSU CHEMICAL CO LTD4-1 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 1000005 ?1000005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hagiwara, Tsuneyuki Tokyo, JP 47 1353
Kondo, Naoto Tokyo, JP 37 778
Mogi, Masayuki Niigata-ken, JP 5 43
Nakatsu, Masayuki Niigata-ken, JP 10 105
Numanami, Tsuneo Niigata-ken, JP 8 58

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