Method and apparatus for measuring a retinal sublayer characteristic
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United States of America Patent
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Mar 25, 2008
Grant Date -
Jan 27, 2005
app pub date -
Apr 28, 2004
filing date -
May 1, 2003
priority date (Note) -
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Abstract
Methods and systems are provided for measuring a retinal sublayer characteristic of an eye. A plurality of axial scans are performed over an area of the retina of the eye. Reflections are measured during the axial scans to determine a plurality of sets of reflection intensity values. A given set of reflection intensity values is associated with one of the plurality of axial scans. A progressive refinement boundary detection algorithm is performed using the plurality of sets of reflection intensity values to determine at least one boundary location associated with the retinal sublayer for each of the plurality of sets of reflection intensity values. The retinal sublayer characteristic is determined in response to the determined boundary locations.
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