Synchronized analyte testing system
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United States of America Patent
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Mar 25, 2008
Grant Date -
Nov 27, 2003
app pub date -
Apr 4, 2003
filing date -
Oct 30, 1996
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An analyte detection system is provided with calibration information uniquely specific to the set of test strips to which the sample is to be applied. The calibration information may be stored in permanent memory of the testing device, such that the device is discarded after use of all the test strips in a kit, or it may be stored in a calibration chip accompanying the set of test strips and distributed therewith, thereby enabling re-use of the testing device with a different set of test strips and associated calibration chip.
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