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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
DELTA DESIGN INC	12367 CROSTHWAITE CIRCLE POWAY CA 92064

International Classification(s)

• G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Brafford, James Mason	Mission Viejo, CA	7	41
Downie, James	Mission Viejo, CA	2	8
Siade, Randy Neaman	Chandler, AZ	4	18

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
April 08, 2008	US,7355386,B2   US7355386B2	GRANTED PATENT AS SECOND PUBLICATION
May 24, 2007	US,20070115015,A1   US20070115015A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7355386

Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester

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