US Patent No: 7,359,066

Number of patents in Portfolio can not be more than 2000

Electro-optical measurement of hysteresis in interferometric modulators

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ALSO PUBLISHED AS: 20060066863
ATTORNEY / AGENT: (SPONSORED)
 

Importance

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Abstract

Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.

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First Claim

Related Publications

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Patent Owner(s)

Patent OwnerAddressTotal Patents
QUALCOMM MEMS TECHNOLOGIES, INC.SAN DIEGO, CA589

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cummings, William J Millbrae, CA 176 2671
Gally, Brian San Rafeal, CA 46 469

Cited Art

Patent Info (Count) # Cites Year
 
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5,608,468 Method and device for multi-format television 231 1995
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5,646,768 Support posts for micro-mechanical devices 288 1995
5,745,193 DMD architecture and timing for use in a pulse-width modulated display system 205 1995
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6,480,177 Blocked stepped address voltage for micromechanical devices 183 1998
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6,282,010 Anti-reflective coatings for spatial light modulators 270 1999
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Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
QUALCOMM MEMS TECHNOLOGIES, INC. (5)
8,111,262 Interferometric modulator displays with reduced color sensitivity 0 2007
7,894,076 Electro-optical measurement of hysteresis in interferometric modulators 1 2008
7,688,452 Determination of interferometric modulator mirror curvature and airgap variation using digital photographs 1 2008
7,955,899 Method for providing and removing discharging interconnect for chip-on-glass output leads and structures thereof 1 2009
8,319,232 Method for providing and removing discharging interconnect for chip-on-glass output leads and structures thereof 0 2011
 
DRAGERWERK AG & CO. KGAA (1)
8,199,326 Gas concentration-measuring device 0 2010

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