Electro-optical measurement of hysteresis in interferometric modulators

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Apr 15, 2008
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Mar 30, 2006
app pub date
Mar 4, 2005
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Sep 27, 2004

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Abstract

Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.

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SNAPTRACK INC	5775 MOREHOUSE DR SAN DIEGO CA 92121

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G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....

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Inventor Name	Address	# of filed Patents	Total Citations
Cummings, William J	San Francisco, CA	130	4870
Gally, Brian	San Rafeal, CA	32	982

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Electro-optical measurement of hysteresis in interferometric modulators

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United States of America Patent

11073295

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PATENT NO	7359066
APP PUB NO	20060066863A1
SERIAL NO	11073295
DOCKET NO

US Family Size	Non-US Coverage
Patent Longevity Expired	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
April 15, 2008	US,7359066,B2 US7359066B2	GRANTED PATENT AS SECOND PUBLICATION
March 30, 2006	US,20060066863,A1 US20060066863A1	FIRST PUBLISHED PATENT APPLICATION

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11073295

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