Semiconductor device and method for testing the same
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United States of America Patent
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Apr 22, 2008
Grant Date -
Feb 10, 2005
app pub date -
Sep 10, 2004
filing date -
May 28, 2002
priority date (Note) -
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Abstract
A semiconductor device, according to the present invention, includes an external input terminal to which first and second input test signals are supplied; a memory circuit, in which a test operation is performed in accordance with the first input test signal to provide a first test result signal; a logic circuit, in which a test operation is performed in accordance with the second input test signal to provide a second test result signal; an external output terminal from which the first and second test result signals are outputted selectively; and a switch circuit which selectively couples the memory circuit and the logic circuit to the external input terminal and the external output terminal.
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