Semiconductor device, method for testing the same and IC card
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United States of America Patent
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Apr 29, 2008
Grant Date -
Nov 16, 2006
app pub date -
Jul 21, 2006
filing date -
Jul 24, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A semiconductor device has a boosting circuit configured to generate a boosting potential to an output line. An internal circuit is supplied with the boosting potential from the boosting circuit via the output line. A test line is connected to the output line. A control circuit is arranged between the output line and the test line and configured to shut off a current flowing into the test line from the output line during a boosting operation of the boosting circuit.
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