System capable of determining applied and anodized coating thickness of a coated-anodized product
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United States of America Patent
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Apr 29, 2008
Grant Date -
Sep 8, 2005
app pub date -
Jan 7, 2005
filing date -
Dec 21, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A system for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.
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