Method and system for generating test pulses to test electronic elements
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United States of America Patent
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May 6, 2008
Grant Date -
Jul 5, 2007
app pub date -
Feb 20, 2007
filing date -
Mar 19, 2004
priority date (Note) -
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Abstract
A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predetermined pulses can be generated. Then the serial of data bits can be transformed into a serial data stream for transmission. By transmitting the serial data stream according to the transmission clock, the serial of predetermined pulses corresponding to the test clock can be generated.
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