Measure-controlled circuit with frequency control
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United States of America Patent
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May 27, 2008
Grant Date -
Apr 5, 2007
app pub date -
Nov 30, 2006
filing date -
May 16, 2002
priority date (Note) -
In Force
status (Latency Note)
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Abstract
Some embodiments include a delay locked circuit having multiple paths. A first path measures a timing of a first clock signal during a measurement. A second path generates a second clock signal based on the first clock signal. The delay locked circuit periodically performs the measurement to adjust a timing relationship between the first and second clock signals. The time interval between one measurement and the next measurement is unequal to the cycle time of the first clock signal. Additional embodiments are disclosed.
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