Methods and devices for quantitative analysis of x-ray images

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United States of America Patent

PATENT NO 7379529
SERIAL NO

11751406

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Abstract

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The present invention relates to network enabled analysis of x-ray images. Also described are devices comprising calibration phantoms; methods of using these devices; methods of formulating databases containing information regarding x-ray images; the databases themselves; and methods of manipulating the information and databases.

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Patent Owner(s)

Patent OwnerAddress
IMATX INC28 CROSBY DRIVE BEDFORD MA 01730

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lang, Philipp Lexington, MA 322 55329

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