Fluorescent x-ray analysis method and fluorescent x-ray analysis device
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United States of America Patent
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Jun 3, 2008
Grant Date -
Oct 25, 2007
app pub date -
Apr 27, 2005
filing date -
Apr 28, 2004
priority date (Note) -
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Abstract
It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.
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