Thick film multilayer reflector with tailored layer thickness profile
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United States of America Patent
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Jun 10, 2008
Grant Date -
Oct 19, 2006
app pub date -
Apr 18, 2005
filing date -
Apr 18, 2005
priority date (Note) -
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Abstract
A multilayer reflector useable to reflect or transmit light over the visible wavelength range includes optically thick constituent layers. The optical thickness of the constituent layers through the thickness of the reflector defines a layer thickness profile. The layers are arranged so that the thickness profile has a tailored non-uniform distribution, such as a graded distribution or a randomized distribution. The layers desirably have an optical thickness in a range from about one to five or one to ten design wavelengths. The reflector can be a polarizer, reflecting only one normally incident polarization state, or a mirror, reflecting two normally incident orthogonal polarization states.
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