Lithographic apparatus and device manufacturing method

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United States of America Patent

PATENT NO 7391499
APP PUB NO 20060119825A1
SERIAL NO

11001646

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Abstract

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A lithographic apparatus for reducing the visibility of artifacts in the pattern is provided. The apparatus comprises an illumination system, a patterning device, a projecting system, and a modulating device. The illumination system supplies a beam of radiation. The patterning device patterns the beam. The projection system projects the beam onto a target portion of a substrate. The modulating device modulates the beam to impart the pattern with a modulation scheme.

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Patent Owner(s)

  • ASML NETHERLANDS B.V.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schmidt, Robert-Han Munnig Hapert, NL 4 30

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